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96
Mots clés
PIXE
Oxygen deficiency
Aluminium
Transparent conductive oxide TCO
Ion beam analysis
17Op
GaMnAs
Low energy electron diffraction LEED
NRA
27Alda
7550Ee
EPR
Nickel
Raman spectroscopy
7630Lh
Topological insulators
AC susceptibility
Al2O3
NRP
18O resonance
XRD
Passivation
Auger electron spectroscopy AES
Epitaxial growth
Adsorption Isotherms
Metal-insulator transition
Photoluminescence
Pb centers
Measurement
Ageing
Silica
Pulsed laser deposition
Magnetic anisotropy
Alloys
Atomic Layer Deposition ALD
Magnetic semiconductors
Oxidation
Acoustic propreties of solid
Charge exchange
Sputtering
Growth
RBS
Gold
Energy loss
Nitridation
Kossel diffraction
Silicon carbide
27Ald p&α
17O
HfO2
Ferromagnetic resonance
Ion implantation
13C
18O
SiC
Annealing
Thin films
Nanostructures
Topological defects
Indium oxide
ADSORPTION DESORPTION HYSTERESIS
Multilayer
Hysteresis
Nanoparticles
Periodic multilayer
Stable isotopic tracing
8140Ef
ALD
Defects
Silicon Carbide
Magnetization curves
Rutherford backscattering spectrometry RBS
Silicon
Density functional theory
17Opp
Adsorption
3C-SiC
AFM
Gallium oxide
X-ray diffraction
15N
2H
Epitaxy
Diffusion
Zinc oxide
Nuclear resonance profiling NRP
Channeling
XPS
Evaluation
27Aldp
Isotopic Tracing
Adsorbed layers
Aluminum
Interface defects
6855Jk
Nuclear reaction analysis
Acoustic
Thin film
Capillary condensation
7550Pp